Miranda, E., Martin-Martinez, J., O'Connor, E., Hughes, G.,Casey, P., Cherkaoui, K.,Monaghan, S., Long, R., O'Connell, D., Hurley, P. K.

2010

Microelectronics Journal

Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks

Published

()

49

9

11

0026-2692