Peer-Reviewed Journal Details
Mandatory Fields
R. D. Long, É. O’Connor, S. Monaghan, K. Cherkaoui, K. K. Thomas, F. Chalvet, I. M. Povey, M. E. Pemble, and P. K. Hurley.P. Casey and G. Hughes S. B. Newcomb.N. Goel, W. Tsai.
2009
Journal of Applied Physics
Structural Analysis, Elemental Profiling, and Electrical Characterisation of HfO2 Thin Films Deposited on In0.53Ga0.47As Surfaces by Atomic Layer Deposition.
Published
()
Optional Fields
106
084508
0021-8979
Grant Details