McNally, PJ;Dilliway, G;Bonar, JM;Willoughby, A;Tuomi, T;Rantamaki, R;Danilewsky, AN;Lowney, D

2000

July

Physica Status Solidi (A) Applied Research

Observation of misfit dislocation strain-induced surface features for a Si/Ge-Si heterostructure using total reflection X-ray topography

Published

0 ()

180

1

3

BERLIN

0031-8965