Reid, I;Zhang, YF;Demasi, A;Blueser, A;Piper, L;Downes, JE;Matsuura, A;Hughes, G;Smith, KE

2009

November

Applied Surface Science

Electronic structure of the organic semiconductor copper tetraphenylporphyrin (CuTPP)

Published

15 ()

RAY PHOTOELECTRON-SPECTROSCOPY SCANNING-TUNNELING-MICROSCOPY THIN-FILMS SYNCHROTRON-RADIATION PHTHALOCYANINE PORPHYRIN SPECTRA SURFACE EMISSION

256

720

725

The electronic structure of thin films of the organic semiconductor copper tetraphenylporphyrin (CuTPP) has been studied using synchrotron radiation-excited resonant soft X-ray emission spectroscopy (RSXE), near edge X-ray absorption. ne structure (NEXAFS) spectroscopy, and X-ray photoemission spectroscopy (XPS). The C and N partial density of states for both the valence and conduction band electronic structure has been determined, while XPS was used to provide information on the chemical composition and the oxidation states of the copper. Good agreement was found between the experimental measurements of the valence and conduction bands and the results of density functional theory calculations. (c) 2009 Elsevier B.V. All rights reserved.

AMSTERDAM

0169-4332

10.1016/j.apsusc.2009.08.048