- Probe station for chip testing
- Selection of optical tunable sources (DFB, DBR, SGDBR, ECL, Y-Branch, etc.)
- Integrated optical frequency comb sources
- Optical coherent receiver for testing > 28 GBaud systems
- 56 GBaud PAM4 system test bed
- 12.5 Gbit/s PPG and BERT Test Set
- 60 GHz radio-over-fibre testbed
- High Resolution (~10 MHz) Optical Spectrum Analysis in C and L Band
- Optical Spectral Analysis from 600nm to 3300nm
- Arbitrary Waveform Generators (30 GHz bandwidth and 92 GSa/s sampling rate)
- Real Time Oscilloscopes (70 GHz bandwidth and 200GSa/s sampling rate
- Electrical Spectrum Analysis at frequencies upto 300 GHz
- RF Signal Generators operating upto 300 GHz with frequency extenders
- Electrical Sampling Scope with 60 GHz Bandwidth
If you would like to request access: https://goo.gl/wAf3uQ
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Prices
Academic: € On-request
Industry: € On-request
Technical Contact Liam Barry Tel: 01-7005431
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