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Optical & Microwave Device/System Characterisation Facility

Key Infrastructure Base

  • Probe station for chip testing
  • Selection of optical tunable sources (DFB, DBR, SGDBR, ECL, Y-Branch, etc.)
  • Integrated optical frequency comb sources
  • Optical coherent receiver for testing > 28 GBaud systems
  • 56 GBaud PAM4 system test bed
  • 12.5 Gbit/s PPG and BERT Test Set
  • 60 GHz radio-over-fibre testbed
  • High Resolution (~10 MHz) Optical Spectrum Analysis in C and L Band
  • Optical Spectral Analysis from 600nm to 3300nm
  • Arbitrary Waveform Generators (30 GHz bandwidth and 92 GSa/s sampling rate)
  • Real Time Oscilloscopes (70 GHz bandwidth and 200GSa/s sampling rate
  • Electrical Spectrum Analysis at frequencies upto 300 GHz
  • RF Signal Generators operating upto 300 GHz with frequency extenders
  • Electrical Sampling Scope with 60 GHz Bandwidth
If you would like to request access:
https://goo.gl/wAf3uQ

Prices
Academic: € On-request
Industry: € On-request
Technical Contact
Liam Barry
Tel: 01-7005431
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