Veeco Dimension 3100 AFM

The Dimension 3100 AFM is a multi-mode atomic force microscope, equipped with a NanoScope IIIa controller for topological imaging of surfaces on the micro and nano scale. Our purpose built AFM lab is equipped with a vibration isolation platform and the instrument is housed in an isolation hood to reduce noise.

The sample stage allows for large samples sizes, with a scan size of up to 100 µm in the X & Y and 6 µm in the Z. As it operates in air, sample preparation is minimal and the instrument is suitable for a large range of applications:

• Polymers
• Biomaterials and Biological Specimens
• Metals
• Thin Films
• Ceramics

• Contact mode
• Tapping mode
• Phase imaging
• Lateral force mode
• Force imaging
• Magnetic force mode

Bruker DektakXT Profilometer

                         
This stylus profiler can be used to perform nanometer scale height, step and surface roughness measurements on an array of sample types.

The Dektak XT features an innovative single-arch design that provides excellent platform stability along with "smart electronics" that results in a low-noise system.  Dektak is the only stylus profiler to measure large vertical features of sensitive materials (up to 1mm tall) with angstrom-level repeatability.

The applications for this system are numerous:

• Thin Film inspection - monitoring deposition and etch rates and thin film stresses
• Surface Roughness verification
• Microfluidics - verifying design and performance

Bruker Dektak 150 Stylus Profilometer

                         
The Dektak provides high speed measurements of surface profiles and roughness on the nanometer scale by moving a stylus of defined size and shape across the surface. There is also the capability to measure residual stress.
These type of measurements are of great interest to industry for quality control of manufactured output and prototyping.
This is also of great interest to the expanding 3D printing capabilities of many research groups in DCU.

Bruker ContourGT Profilometer

                         
This is the Bruker ContourGT 3D optical microscope which provides high speed measurements of surface profiles and roughness on the nanometer scale.
Featuring:

• Unique metrolgy sensor design with patented dual-LED light source
• Self-calibrating, metrology optimizing laser reference
• Integral vibration-isolation floor mount cabinet
• Fully automated measurement capabilities (focus, intensity, tip/tilt head, staging, FOV)
• Nanometer-scale resolution on high-contour surfaces
• Streamlined, customizable production interface
• Real-time automated measurement optimization 
• Extensive library of filters and customizable analysis options