Hitachi S5500 Field Emission SEM

                         
Ultra-high resolution PC controlled SEM with a maximum magnification of x 2,000,000.
Capable of scanning and transmission imaging modes.
Typically used for the imaging of nanoparticulate materials. EDX is also available, as is a cryogenic sample stage for volatile samples.

(please note that prices shown are guide price only as sample prep and EDX can affect the cost)

Jeol JSM-IT 100 InTouchScope SEM

• Capable of handling large samples
• A long working distance allows easy examination of tilted samples
• Environmental option allows reduction of charge buildup on non-conducting samples by allowing air into sample chamber
• Suitable for samples in Life Sciences, Materials Science & Additive Manufacturing

Hitachi S3400N VP-SEM

A wide range SEM for general purpose research use. Maximum magnification x 300,000.
Uses 2 primary detectors and the variable chamber pressure allows charge up-free observation of any sample without special preparation techniques such as coating.